IEC - International Electrotechnical Commission - IEC 60147-1:1972
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1972 |
| Status: | withdrawn |
| Page Count: | 63 |
| ICS Code (Diodes): | 31.080.10 |
Document History
IEC 60147-1:1972
January 1, 1972
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
A description is not available for this item.
January 1, 1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
This second edition supersedes IEC 147-1 (1963) and 147-1A (1963). Provides for each type of semiconductor device a list of essential ratings and characteristics, the primary purpose of which is to...