IEC - International Electrotechnical Commission - IEC 60147-1:1963

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics

revised
Buy Now
Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1963
Status: revised
Page Count: 21
ICS Code (Diodes): 31.080.10
abstract:

This second edition supersedes IEC 147-1 (1963) and 147-1A (1963). Provides for each type of semiconductor device a list of essential ratings and characteristics, the primary purpose of which is... View More

Document History

January 1, 1972
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
A description is not available for this item.
IEC 60147-1:1963
January 1, 1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
This second edition supersedes IEC 147-1 (1963) and 147-1A (1963). Provides for each type of semiconductor device a list of essential ratings and characteristics, the primary purpose of which is to...
Advertisement