IEC - International Electrotechnical Commission - IEC 60747-5-3:1997
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 5 September 1997 |
| Status: | replaced |
| Page Count: | 61 |
| ICS Code (Optoelectronics. Laser equipment): | 31.260 |
abstract:
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Document History
November 25, 2009
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated...
March 25, 2002
Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
A description is not available for this item.
IEC 60747-5-3:1997
September 5, 1997
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.