IEC - International Electrotechnical Commission - IEC 60747-5-3:1997/AMD1:2002

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

replaced
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Organization: IEC - International Electrotechnical Commission
Publication Date: 25 March 2002
Status: replaced
Page Count: 25
ICS Code (Other semiconductor devices): 31.080.99

Document History

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems. This consolidated...
IEC 60747-5-3:1997/AMD1:2002
March 25, 2002
Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
A description is not available for this item.
September 5, 1997
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
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