IEC - International Electrotechnical Commission - IEC 62276:2012
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 19 October 2012 |
| Status: | revised |
| Page Count: | 82 |
| ICS Code (Piezoelectric devices): | 31.140 |
abstract:
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers... View More
Document History
October 24, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
IEC 62276:2016 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
IEC 62276:2012
October 19, 2012
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
May 30, 2005
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium...