IEEE - Institute of Electrical and Electronics Engineers, Inc. - P62.32_D12, Nov 2009

IEEE Draft Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2009
Status: inactive
ICS Code (Substations. Surge arresters): 29.240.10
ISBN (Electronic): 978-1-5044-2502-5
Standard:

This standard applies to the avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche breakdown diode surge... View More

Document History

P62.32_D12, Nov 2009
January 1, 2009
IEEE Draft Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
This standard applies to the avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche breakdown diode surge...

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