ASTM International - ASTM E2444-11(2018)
Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
|Publication Date:||1 May 2018|
|ICS Code (Electronics (Vocabularies)):||01.040.31|
|ICS Code (Mechanical structures for electronic equipment):||31.240|
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanic
1.2 The terms are listed in alphabetical order.
1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.