ASTM International - ASTM F219-96(2018)

Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps

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Organization: ASTM International
Publication Date: 1 March 2018
Status: active
Page Count: 3
ICS Code (Wires): 29.060.10
scope:

1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps.

1.2 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

abstract:

These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. Chemical analysis of... View More

Document History

ASTM F219-96(2018)
March 1, 2018
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. 1.2 The values...
May 1, 2013
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. 1.2 The values...
May 1, 2009
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. 1.2 The values...
December 10, 1996
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. 1.2 The values...
December 10, 1996
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
1.1 These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps. 1.2 The values...
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