IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1149.10-2017

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 28 July 2017
Status: active
Page(s): 1 - 96
ISBN (Electronic): 978-1-5044-3995-4
DOI: 10.1109/IEEESTD.2017.7995164
Regular:

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die... View More

Standard:

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die... View More

Document History

1149.10-2017
July 28, 2017
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal...
January 1, 2017
IEEE Approved Draft High Speed Test Access Port and On-chip Distribution Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards, assembled multi-die packages and the test of die internal...
January 1, 2016
IEEE Draft High Speed Test Access Port and On-chip Distribution Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards, assembled multi-die packages and the test of die internal...
January 1, 2016
IEEE Draft High Speed Test Access Port and On-chip Distribution Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards, assembled multi-die packages and the test of die internal...
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