IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth

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Organization: IEC - International Electrotechnical Commission
Publication Date: 13 June 2005
Status: published
Page Count: 63
ICS Code (Environmental testing): 19.040

Abstracts

abstract

IEC 60068-2-10:2005 Provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant properties of the product. Since mould growth conditions include high relative humidity, the test is applicable to electrotechnical products intended for transportation, storage and use under humid conditions over a period of some days at least. The main changes with respect to the previous edition are listed below:
- Two test fungi replaced by two others
- Concentration of the spores defined for each test fungus
- Spores suspension in mineral salt solution additionally introduced
- Pre-conditioning of the specimens by damp heat storage prescribed
- Supersonic aerosolization of the spores suspension as the preferred inoculation method introduced
- Duration of incubation reduced from 84 days to 56 days
- Extent of mould growth grade 2 split into grade 2a and grade 2b
- Detailed information on methods of inoculation given in Annex B
- Annex E: flow-chart deleted It has the status of a horizontal standard in accordance with IEC Guide 104

Document History

IEC 60068-2-10:2005+AMD1:2018 CSV - Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
April 25, 2018 - IEC - International Electrotechnical Commission

IEC 60068-2-10:2005+A1:2018 provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant properties of the product. Since mould growth conditions include high relative humidity, the te...

IEC 60068-2-10:2005/AMD1:2018 - Amendment 1 - Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
April 25, 2018 - IEC - International Electrotechnical Commission
A description is not available for this item.
IEC 60068-2-10:2005 - Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
June 13, 2005 - IEC - International Electrotechnical Commission

IEC 60068-2-10:2005 Provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant properties of the product. Since mould growth conditions include high relative humidity, the test is ap...

IEC 60068-2-10:1988 - Basic environmental testing procedures - Part 2-10: Tests - Test J and guidance: Mould growth
May 15, 1988 - IEC - International Electrotechnical Commission

This test covers the inoculation of assembled specimens with a selection of mould spores followed by a period of incubation under conditions which promote spore germination and the growth of mould. Two variations of the test are given. Variant 1 specifies direct inoculation of the specimen with the ...

IEC 60068-2-10:1984 - Basic environmental testing procedures - Part 2: Tests - Test J: Mould growth
January 1, 1984 - IEC - International Electrotechnical Commission
A description is not available for this item.
IEC 60068-2-10:1968 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test J: Mould growth
January 1, 1968 - IEC - International Electrotechnical Commission
A description is not available for this item.
IEC 60068-2-10:1960 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test J: Mould growth
January 1, 1960 - IEC - International Electrotechnical Commission
A description is not available for this item.
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