IEC - International Electrotechnical Commission - IEC 61010-031:2015 RLV
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
|Organization:||IEC - International Electrotechnical Commission|
|Publication Date:||29 May 2015|
|ICS Code (Electrical and electronic testing):||19.080|
IEC 61010-031:2015 RLV contains both the official IEC International Standard and its Redline version. The Redline version is not an official document, it is available in English only and provides... View More
IEC 61010-031:2015 RLV contains both the official IEC International Standard and its Redline version. The Redline version is not an official document, it is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 61010-031:2015 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and their related accessories. These probe assemblies are for direct electrical connection between a part and electrical test and measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment. It has the status of a group safety publication in accordance with IEC GUIDE 104. IEC 61010-031 is a stand-alone standard. This second edition cancels and replaces the first edition published in 2002 and Amendment 1:2008. This edition constitutes a technical revision. This edition includes the following significant changes from the first edition, as well as numerous other changes:
a) Voltages above the levels of 30 V r.m.s., 42,4 V peak, or 60 V d.c. are deemed to be HAZARDOUS LIVE instead of 33 V r.m.s., 46,7 V peak, or 70 V d.c.
b) Servicing is now included within the scope.
c) Extended environmental conditions are included within the scope.
d) New terms have been defined.
e) Tests for REASONABLY FORESEEABLE MISUSE have been added, in particular for fuses.
f) Additional instruction requirements for probe assembly operation have been specified.
g) Limit values for ACCESSIBLE parts and for measurement of voltage and touch current have been modified.
h) SPACINGS requirements for mating of CONNECTORS have been modified.
i) PROBE TIPS and SPRING-LOADED CLIPS requirements have been modified. The PROTECTIVE FINGERGUARD replace the BARRIER with new requirements.
j) Insulation requirements (6.5) and test procedures (6.6.5) have been rewritten and aligned when relevant with Part 1. Specific requirements have been added for solid insulation and thin-film insulation.
k) The terminology for MEASUREMENT CATEGORY I has been replaced with the designation "not RATED for measurements within MEASUREMENT CATEGORIES II, III, or IV".
l) The flexing/pull test (18.104.22.168) has been partially rewritten.
m) Surface temperature limits (Clause 10) have been modified to conform to the limits of IEC Guide 117.
n) Requirements for resistance of PROBE WIRES to mechanical stresses have been added in Clause 12 and a new Annex D.
o) Requirements have been added regarding the prevention of HAZARD from arc flash and short-circuits for SPRING-LOADED CLIPS.
p) A new informative Annex E defines the dimension of the 4 mm banana CONNECTORS.