IEC - International Electrotechnical Commission - IEC 62226-3-1:2007+AMD1:2016 CSV

Exposure to electric or magnetic fields in the low and intermediatefrequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 3-1: Exposure to electric fields - Analytical and 2D numerical models

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Organization: IEC - International Electrotechnical Commission
Publication Date: 7 October 2016
Status: published
Page Count: 225
ICS Code (Measurement of electrical and magnetic quantities): 17.220.20
abstract:

IEC 62226-3-1:2007+A1:2016 Applies to the frequency range for which exposure limits are based on the induction of voltages or currents in the human body when exposed to electric fields.... View More

Document History

IEC 62226-3-1:2007+AMD1:2016 CSV
October 7, 2016
Exposure to electric or magnetic fields in the low and intermediatefrequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 3-1: Exposure to electric fields - Analytical and 2D numerical models
IEC 62226-3-1:2007+A1:2016 Applies to the frequency range for which exposure limits are based on the induction of voltages or currents in the human body when exposed to electric fields. Defines in...
Amendment 1 - Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 3-1: Exposure to electric fields - Analytical and 2D numerical models
A description is not available for this item.
May 23, 2007
Exposure to electric or magnetic fields in the low and intermediate frequency range - Methods for calculating the current density and internal electric field induced in the human body - Part 3-1: Exposure to electric fields - Analytical and 2D numerical models
Applies to the frequency range for which exposure limits are based on the induction of voltages or currents in the human body when exposed to electric fields. Defines in detail the coupling factor K...
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