IEC - International Electrotechnical Commission - IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 14 December 2015
Status: published
Page Count: 162
ICS Code (Industrial automation systems in general): 25.040.01
abstract:

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace... View More

Document History

IEC 63003:2015
December 14, 2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...
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