IEC - International Electrotechnical Commission - IEC 60749-43:2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 15 June 2017 |
| Status: | replaced |
| Page Count: | 74 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related... View More
Document History
IEC 60749-43:2017
June 15, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.