IEC - International Electrotechnical Commission - IEC 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 15 June 2017
Status: published
Page Count: 74
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related... View More

Document History

IEC 60749-43:2017
June 15, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
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