IEC - International Electrotechnical Commission - IEC 60404-2:1996/AMD1:2008
Amendment 1 - Magnetic materials - Part 2: Methods of measurement of magnetic properties of electrical steel strip and sheet by means of an Epstein frame
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 29 April 2008 |
| Status: | published |
| Page Count: | 13 |
| ICS Code (Magnetic materials): | 29.030 |
| ICS Code (Measurement of electrical and magnetic quantities): | 17.220.20 |
abstract:
The contents of the corrigendum of March 2018 have been included in this copy.
Document History
March 22, 2018
Corrigendum 1 - Amendment 1 - Magnetic materials - Part 2: Methods of measurement of magnetic properties of electrical steel strip and sheet by means of an Epstein frame
A description is not available for this item.
June 25, 2008
Magnetic materials - Part 2: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of an Epstein frame
Applies to grain oriented and non-oriented electrical sheet and strip for a.c. measurements of magnetic properities at frequencies up to 400 Hz and for d.c. magnetic measurements. Defines the general...
IEC 60404-2:1996/AMD1:2008
April 29, 2008
Amendment 1 - Magnetic materials - Part 2: Methods of measurement of magnetic properties of electrical steel strip and sheet by means of an Epstein frame
The contents of the corrigendum of March 2018 have been included in this copy.
March 28, 1996
Magnetic materials - Part 2: Methods of measurement of the magneticproperties of electrical steel sheet and strip by means of anEpstein frame
Applies to grain oriented and non-oriented electrical sheet and strip for a.c. measurements of magnetic properities at frequencies up to 400 Hz and for d.c. magnetic measurements. Defines the general...
January 1, 1978
Magnetic materials. Part 2: Methods of measuring of magnetic, electrical and physical properties of magnetic sheet and strip.
Describes the standard 25 cm Epstein frame and associated circuitry, to be used for determining the B-H characteristic (both for d.c. and for sinusoidal secondary voltage), specific total losses,...