IEC - International Electrotechnical Commission - IEC 62526:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 7 November 2007
Status: published
Page Count: 123
ICS Code (Industrial automation systems in general): 25.040.01
abstract:

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE... View More

Document History

IEC 62526:2007
November 7, 2007
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE...
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