IEC - International Electrotechnical Commission - IEC 62429:2007
Reliability growth - Stress testing for early failures in unique complex systems
published
Buy Now
| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 30 November 2007 |
| Status: | published |
| Page Count: | 71 |
| ICS Code (Quality in general): | 03.120.01 |
| ICS Code (Other standards related to quality): | 03.120.99 |
abstract:
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and... View More
Document History
IEC 62429:2007
November 30, 2007
Reliability growth - Stress testing for early failures in unique complex systems
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria...