IEC 60068-2-82:2007 Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components

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Organization: IEC - International Electrotechnical Commission
Publication Date: 23 May 2007
Status: published
Page Count: 32
ICS Code (Environmental testing): 19.040

Abstracts

abstract

IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress.

This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.

The contents of the corrigendum of December 2009 have been included in this copy.

Document History

IEC 60068-2-82:2007/COR1:2009 - Corrigendum 1 - Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components
December 17, 2009 - IEC - International Electrotechnical Commission
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IEC 60068-2-82:2007 - Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components
May 23, 2007 - IEC - International Electrotechnical Commission

IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress.

This test method is employed by a releva...

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