IEC - International Electrotechnical Commission - IEC 60404-4:1995/AMD2:2008

Amendment 2 - Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 24 September 2008
Status: published
Page Count: 5
ICS Code (Magnetic materials): 29.030
ICS Code (Measurement of electrical and magnetic quantities): 17.220.20

Document History

Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials
Describes the terminology and two measuring methods, namely: the ring method and the permeameter method. Both methods use a test specimen in a closed magnetic circuit. Description of the test...
IEC 60404-4:1995/AMD2:2008
September 24, 2008
Amendment 2 - Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials
A description is not available for this item.
November 28, 2000
Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of magnetically soft materials
Describes the terminology and two measuring methods, namely: the ring method and the permeameter method. Both methods use a test specimen in a closed magnetic circuit. Description of the test...
Amendment 1 - Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of iron and steel
A description is not available for this item.
February 15, 1995
Magnetic materials - Part 4: Methods of measurement of d.c. magnetic properties of iron and steel
Describes the terminology and two measuring methods, namely: the ring method and the permeameter method. Both methods use a test specimen in a closed magnetic circuit. Description of the test...
January 1, 1982
Magnetic materials - Part 4: Methods of measurement of the d.c. magnetic properties of solid steels
Describes the terminology and two measuring methods, namely: the ring method and the permeameter method. Both methods use a test specimen in a closed magnetic circuit. Description of the test...
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