IEC - International Electrotechnical Commission - IEC PAS 62162:2000
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface... View More
Document History
IEC PAS 62162:2000
August 22, 2000
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic...