IEC - International Electrotechnical Commission - IEC 62047-7:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

published
Buy Now
Organization: IEC - International Electrotechnical Commission
Publication Date: 16 June 2011
Status: published
Page Count: 56
ICS Code (Other semiconductor devices): 31.080.99
abstract:

IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and... View More

Document History

IEC 62047-7:2011
June 16, 2011
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and...
Advertisement