IEC - International Electrotechnical Commission - IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 26 April 2010 |
| Status: | published |
| Page Count: | 20 |
| ICS Code (Transistors): | 31.080.30 |
abstract:
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the... View More
Document History
IEC 62416:2010
April 26, 2010
Semiconductor devices - Hot carrier test on MOS transistors
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required...