IEC - International Electrotechnical Commission - IEC 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 9 March 2004 |
| Status: | published |
| Page Count: | 6 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam... View More
Document History
IEC 60749-33:2004
March 9, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam...