IEC - International Electrotechnical Commission - IEC 60249-1:1982/AMD3:1991
Amendment 3 - Base materials for printed circuits. Part 1: Test methods
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1991 |
| Status: | replaced |
| Page Count: | 15 |
| ICS Code (Printed circuits and boards): | 31.180 |
Document History
May 13, 1993
Amendment 4 - Base materials for printed circuits. Part 1: Test methods
Contains Amendments Nos. 1, 2 and 3.
IEC 60249-1:1982/AMD3:1991
January 1, 1991
Amendment 3 - Base materials for printed circuits. Part 1: Test
methods
A description is not available for this item.
September 1, 1989
Amendment 2 - Base materials for printed circuits. Part 1: Test
methods
A description is not available for this item.
January 1, 1984
Amendment 1 - Base materials for printed circuits. Part 1: Test methods
A description is not available for this item.
January 1, 1982
Base materials for printed circuits. Part 1: Test methods
Describes methods for testing electrical, mechanical and other properties of base materials in sheet or roll form for application in the field of printed circuits irrespective of the nature of the...
January 1, 1968
Metal-clad base materials for printed circuits - Part 1 : Test methods
Describes methods for testing electrical, mechanical and other properties of base materials in sheet or roll form for application in the field of printed circuits irrespective of the nature of the...