IEC - International Electrotechnical Commission - IEC 60147-5:1977
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 5: Mechanical and climatic test methods
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1977 |
| Status: | replaced |
| Page Count: | 37 |
| ICS Code (Diodes): | 31.080.10 |
Document History
IEC 60147-5:1977
January 1, 1977
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 5: Mechanical and climatic test methods
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