IEC - International Electrotechnical Commission - IEC 61164:1995
Reliability growth - Statistical test and estimation methods
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 27 June 1995 |
| Status: | revised |
| Page Count: | 61 |
| ICS Code (Quality in general): | 03.120.01 |
| ICS Code (Application of statistical methods): | 03.120.30 |
| ICS Code (Characteristics and design of machines, apparatus, equipment): | 21.020 |
abstract:
This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.
Document History
March 24, 2004
Reliability growth - Statistical test and estimation methods
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with...
IEC 61164:1995
June 27, 1995
Reliability growth - Statistical test and estimation methods
This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.