IEC - International Electrotechnical Commission - IEC PAS 62483:2006
Test method for measuring whisker growth on tin and tin alloy surface finishes
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 12 September 2006 |
| Status: | replaced |
| Page Count: | 27 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special... View More
Document History
IEC PAS 62483:2006
September 12, 2006
Test method for measuring whisker growth on tin and tin alloy surface finishes
Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special...