IEC - International Electrotechnical Commission - IEC 61280-2-2:2008
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
revised
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Organization: | IEC - International Electrotechnical Commission |
Publication Date: | 11 March 2008 |
Status: | revised |
Page Count: | 53 |
ICS Code (Fibre optic systems in general): | 33.180.01 |
abstract:
This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform... View More
Document History

February 17, 2015
Corrigendum 1 - Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
A description is not available for this item.

October 25, 2012
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
IEC 61280-2-2:2012 describes a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation...

IEC 61280-2-2:2008
March 11, 2008
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform...

April 27, 2005
Fibre optic communication subsystem test procedures - Part 2-2: Digital systems - Optical eye pattern, waveform and extinction ratio measurement
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with...

November 30, 1998
Fibre optic communication subsystem basic test procedures - Part 2-2: Test procedures for digital systems - Optical eye pattern, waveform, and extinction ratio
Describes a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance...