IEC - International Electrotechnical Commission - IEC PAS 60679-6:2008
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 27 February 2008 |
| Status: | replaced |
| Page Count: | 21 |
| ICS Code (Piezoelectric devices): | 31.140 |
abstract:
IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate... View More
Document History
IEC PAS 60679-6:2008
February 27, 2008
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate...