IEC - International Electrotechnical Commission - IEC 60410:1973
Sampling plans and procedures for inspection by attributes
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1973 |
| Status: | withdrawn |
| Page Count: | 82 |
| ICS Code (Characteristics and design of machines, apparatus, equipment): | 21.020 |
| ICS Code (Electronic components in general): | 31.020 |
abstract:
Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations,... View More
Document History
IEC 60410:1973
January 1, 1973
Sampling plans and procedures for inspection by attributes
Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations,...