IEC - International Electrotechnical Commission - IEC TS 62396-2:2008
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 19 August 2008 |
| Status: | replaced |
| Page Count: | 27 |
| ICS Code (Production. Production management): | 03.100.50 |
| ICS Code (Electronic components in general): | 31.020 |
| ICS Code (Aerospace electric equipment and systems): | 49.060 |
abstract:
IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric... View More
Document History
IEC TS 62396-2:2008
August 19, 2008
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric...