IEC - International Electrotechnical Commission - IEC PAS 62181:2000
IC latch-up test
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 21 July 2000 |
| Status: | replaced |
| Page Count: | 19 |
abstract:
Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these... View More
Document History
IEC PAS 62181:2000
July 21, 2000
IC latch-up test
Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.