IEC - International Electrotechnical Commission - IEC PAS 62180:2000
Electrostatic discharge (ESD) sensitivity testing machine model (MM)
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic... View More
Document History
IEC PAS 62180:2000
August 22, 2000
Electrostatic discharge (ESD) sensitivity testing machine model (MM)
Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic...