IEC - International Electrotechnical Commission - IEC PAS 62161:2000
Steady state temperature humidity bias life test
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 6 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of... View More
Document History
IEC PAS 62161:2000
August 22, 2000
Steady state temperature humidity bias life test
Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of...