IEC - International Electrotechnical Commission - IEC PAS 62163:2000

External visual test method

replaced
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Organization: IEC - International Electrotechnical Commission
Publication Date: 22 August 2000
Status: replaced
Page Count: 3
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External... View More

Document History

IEC PAS 62163:2000
August 22, 2000
External visual test method
The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External...
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