IEC - International Electrotechnical Commission - IEC PAS 62163:2000
External visual test method
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 3 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External... View More
Document History
IEC PAS 62163:2000
August 22, 2000
External visual test method
The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External...