IEC - International Electrotechnical Commission - IEC PAS 62184:2000
Lead integrity test method
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 22 August 2000 |
| Status: | replaced |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for... View More
Document History
IEC PAS 62184:2000
August 22, 2000
Lead integrity test method
Provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for reassembly.