IEC - International Electrotechnical Commission - IEC PAS 62189:2000
Bias Life
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 28 November 2000 |
| Status: | replaced |
| Page Count: | 6 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and... View More
Document History
IEC PAS 62189:2000
November 28, 2000
Bias Life
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and...