IEC - International Electrotechnical Commission - IEC 60147-4:1976

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 4: Acceptance and reliability

withdrawn
Buy Now
Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1976
Status: withdrawn
Page Count: 39
ICS Code (Diodes): 31.080.10
abstract:

Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized... View More

Document History

IEC 60147-4:1976
January 1, 1976
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 4: Acceptance and reliability
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for...
Advertisement