IEC - International Electrotechnical Commission - IEC 60147-2M:1980
Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1980 |
| Status: | withdrawn |
| Page Count: | 73 |
| ICS Code (Diodes): | 31.080.10 |
abstract:
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern... View More
Document History
IEC 60147-2M:1980
January 1, 1980
Supplement M - Essential ratings and characteristics of
semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques...