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IEC - International Electrotechnical Commission - IEC 60147-2M:1980

Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

withdrawn
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Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1980
Status: withdrawn
Page Count: 73
ICS Code (Diodes): 31.080.10
abstract:

Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern... View More

Document History

IEC 60147-2M:1980
January 1, 1980
Supplement M - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques...
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