IEC - International Electrotechnical Commission - IEC 60147-2K:1978

Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

withdrawn
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Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1978
Status: withdrawn
Page Count: 55
ICS Code (Diodes): 31.080.10
abstract:

Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave... View More

Document History

IEC 60147-2K:1978
January 1, 1978
Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer...
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