IEC - International Electrotechnical Commission - IEC 60147-2K:1978
Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1978 |
| Status: | withdrawn |
| Page Count: | 55 |
| ICS Code (Diodes): | 31.080.10 |
abstract:
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave... View More
Document History
IEC 60147-2K:1978
January 1, 1978
Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer...