IEC - International Electrotechnical Commission - IEC 60147-2:1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1963 |
| Status: | withdrawn |
| Page Count: | 55 |
| ICS Code (Diodes): | 31.080.10 |
abstract:
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually... View More
Document History
IEC 60147-2:1963
January 1, 1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually...