IEC - International Electrotechnical Commission - IEC 60147-2:1963

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

withdrawn
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Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1963
Status: withdrawn
Page Count: 55
ICS Code (Diodes): 31.080.10
abstract:

Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually... View More

Document History

IEC 60147-2:1963
January 1, 1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually...
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