IEC - International Electrotechnical Commission - IEC 60147-0:1966
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1966 |
| Status: | withdrawn |
| Page Count: | 57 |
| ICS Code (Diodes): | 31.080.10 |
abstract:
Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and... View More
Document History
IEC 60147-0:1966
January 1, 1966
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.