IEC - International Electrotechnical Commission - IEC 60147-2C:1970

Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

withdrawn
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Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1970
Status: withdrawn
Page Count: 73
ICS Code (Diodes): 31.080.10
abstract:

Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring... View More

Document History

IEC 60147-2C:1970
July 28, 1970
Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring...
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