IEC - International Electrotechnical Commission - IEC 60147-2C:1970
Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1970 |
| Status: | withdrawn |
| Page Count: | 73 |
| ICS Code (Diodes): | 31.080.10 |
abstract:
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring... View More
Document History
IEC 60147-2C:1970
July 28, 1970
Supplement C - Essential ratings and characteristics of
semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring...