IEC - International Electrotechnical Commission - IEC 61709:2011
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 24 June 2011 |
| Status: | revised |
| Page Count: | 181 |
| ICS Code (Electronic components in general): | 31.020 |
abstract:
IEC 61709:2011 gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment. Reference conditions are numerical values of stresses that... View More
Document History
October 10, 2019
Corrigendum 1 - Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
A description is not available for this item.
February 17, 2017
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
IEC 61709:2017 is also available as IEC 61709:2017 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous...
February 17, 2017
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
IEC 61709:2017 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to...
IEC 61709:2011
June 24, 2011
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
IEC 61709:2011 gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment. Reference conditions are numerical values of stresses that are...
October 17, 1996
Electronic components - Reliability - Reference conditions for failure rates and stress models for conversion
Gives guidance on the use of failure rate data for the reliability prediction of components in electronic equipment. Reference conditions for failure rate data are specified, so that data from...