IEC - International Electrotechnical Commission - IEC 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 4 July 2003
Status: revised
Page Count: 11
ICS Code (Piezoelectric devices): 31.140
abstract:

Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz... View More

Document History

December 15, 2016
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
IEC 60444-8:2016 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series)...
IEC 60444-8:2003
July 4, 2003
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal...
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