IEC - International Electrotechnical Commission - IEC 60749-7:2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 9 April 2002 |
| Status: | revised |
| Page Count: | 15 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a... View More
Document History
June 17, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
IEC 60749-7:2011 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of...
August 12, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Modification of the validity date: now put at 2007.
IEC 60749-7:2002
April 9, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a...