IEC - International Electrotechnical Commission - IEC 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 10 March 2004
Status: revised
Page Count: 8
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This... View More

Document History

October 28, 2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
IEC 60749-34:2010 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal...
IEC 60749-34:2004
March 10, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This...
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