IEC - International Electrotechnical Commission - IEC 60068-2-10:1968

Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test J: Mould growth

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1968
Status: revised
Page Count: 20
ICS Code (Environmental testing): 19.040

Document History

Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-10:2005+A1:2018 provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other...
Amendment 1 - Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
A description is not available for this item.
June 13, 2005
Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-10:2005 Provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant...
May 15, 1988
Basic environmental testing procedures - Part 2-10: Tests - Test J and guidance: Mould growth
This test covers the inoculation of assembled specimens with a selection of mould spores followed by a period of incubation under conditions which promote spore germination and the growth of mould....
January 1, 1984
Basic environmental testing procedures - Part 2: Tests - Test J: Mould growth
A description is not available for this item.
IEC 60068-2-10:1968
January 1, 1968
Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test J: Mould growth
A description is not available for this item.
January 1, 1960
Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test J: Mould growth
A description is not available for this item.
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