IEC - International Electrotechnical Commission - IEC 62007-2:1997+AMD1:1998 CSV
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 26 February 1999 |
| Status: | revised |
| Page Count: | 117 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
| ICS Code (Optoelectronics. Laser equipment): | 31.260 |
| ICS Code (Fibre optic systems in general): | 33.180.01 |
abstract:
Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems.
This consolidated version consists of the first... View More
Document History
January 26, 2009
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
IEC 62007-2:2009 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. This...
IEC 62007-2:1997+AMD1:1998 CSV
February 26, 1999
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems. This consolidated version consists of the first edition (1997)...
August 25, 1998
Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
A description is not available for this item.
September 17, 1997
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems.