ASTM International - ASTM F1190-99

Standard Guide for Neutron Irradiation of Unbiased Electronic Components

historical
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Organization: ASTM International
Publication Date: 10 January 1999
Status: historical
Page Count: 5
ICS Code (Electronic components in general): 31.020
ICS Code (Semiconductor devices in general): 31.080.01
scope:

1.1 This practice applies to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components to neutron radiation from a nuclear reactor source. Only the conditions of exposure are addressed in this practice. The effects of radiation on the test sample should be determined using appropriate electrical test methods.

1.2 System and subsystem exposures and test methods are not included in this practice.

1.3 This practice is applicable to irradiations conducted with the reactor operating in either the pulsed or steady-state mode. The practical limits for neutron fluence ([phi]eq,1MeV,Si or [phi]eq,1MeV,GaAs) in semiconductor testing range from approximately 10 to 10 16 n/cm .

1.4 This practice addresses those issues and concerns pertaining to irradiations with neutrons of energies greater than 10 keV.

1.5 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

March 1, 2018
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation...
October 1, 2011
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1.1 This guide strictly applies only to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation...
January 1, 2005
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1.1 This guide strictly applies only to the exposure of unbiased silicon (SI) or gallium arsenide (GaAs) semiconductor components (integrated circuits, transistors, and diodes) to neutron radiation...
ASTM F1190-99
January 10, 1999
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1.1 This practice applies to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components to neutron radiation from a nuclear reactor source. Only the conditions of...
January 10, 1999
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
1.1 This practice applies to the exposure of unbiased silicon (Si) or gallium arsenide (GaAs) semiconductor components to neutron radiation from a nuclear reactor source. Only the conditions of...
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